Advanced characterization techniques for optics, semiconductors, and nanotechnologies III
28-29 August 2007, San Diego, California, USA
By Angela Duparré
"Advanced characterization techniques for optics, semiconductors, and nanotechnologies III" is published by SPIE in 2007 - Bellingham, Wash and the language of the book is English.
“Advanced characterization techniques for optics, semiconductors, and nanotechnologies III” Metadata:
- Title: ➤ Advanced characterization techniques for optics, semiconductors, and nanotechnologies III
- Author: Angela Duparré
- Language: English
- Publisher: SPIE
- Publish Date: 2007
- Publish Location: Bellingham, Wash
“Advanced characterization techniques for optics, semiconductors, and nanotechnologies III” Subjects and Themes:
- Subjects: ➤ Optical properties - Characterization - Semiconductors - Optoelectronics - Thin films - Optoelectronic devices - Congresses - Optical measurements - Nanotechnology - Interferometry
Edition Specifications:
- Pagination: 1 v. (various pagings) :
Edition Identifiers:
- The Open Library ID: OL25085345M - OL16238130W
- Online Computer Library Center (OCLC) ID: 174117963
- Library of Congress Control Number (LCCN): 2010287972
- ISBN-13: 9780819468208
- ISBN-10: 0819468207
- All ISBNs: 0819468207 - 9780819468208
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