Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - Info and Reading Options
2-4 August, 2005, San Diego, California, USA
By SPIE
"Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II" was published by SPIE-International Society for Optical Engine in January 2005, it has 1 pages and the language of the book is English.
“Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II” Metadata:
- Title: ➤ Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
- Author: SPIE
- Language: English
- Number of Pages: 1
- Publisher: ➤ SPIE-International Society for Optical Engine
- Publish Date: January 2005
“Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II” Subjects and Themes:
- Subjects: ➤ Optoelectronics - Congresses - Optoelectronic devices - Optical measurements - Semiconductors - Characterization - Thin films - Optical properties - Nanotechnology
Edition Specifications:
- Format: Paperback
Edition Identifiers:
- The Open Library ID: OL11393681M - OL9205650W
- Library of Congress Control Number (LCCN): 2005284407
- ISBN-13: 9780819458834
- ISBN-10: 081945883X
- All ISBNs: 081945883X - 9780819458834
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