Advanced characterization techniques for optics, semiconductors, and nanotechnologies
3-5 August 2003, San Diego, California, USA
By Angela Duparré
"Advanced characterization techniques for optics, semiconductors, and nanotechnologies" is published by SPIE in 2003 - Bellingham, Wash., USA, it has 402 pages and the language of the book is English.
“Advanced characterization techniques for optics, semiconductors, and nanotechnologies” Metadata:
- Title: ➤ Advanced characterization techniques for optics, semiconductors, and nanotechnologies
- Author: Angela Duparré
- Language: English
- Number of Pages: 402
- Publisher: SPIE
- Publish Date: 2003
- Publish Location: Bellingham, Wash., USA
“Advanced characterization techniques for optics, semiconductors, and nanotechnologies” Subjects and Themes:
- Subjects: ➤ Optical properties - Characterization - Semiconductors - Optoelectronics - Thin films - Optoelectronic devices - Congresses - Optical measurements - Nanotechnology
Edition Specifications:
- Pagination: x, 402 p. :
Edition Identifiers:
- The Open Library ID: OL3325288M - OL18830284W
- Online Computer Library Center (OCLC) ID: 53898281
- Library of Congress Control Number (LCCN): 2004298723
- ISBN-13: 9780819450616
- ISBN-10: 0819450618
- All ISBNs: 0819450618 - 9780819450616
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