Advanced characterization techniques for optical, semiconductor, and data storage components
9-11 July 2002, Seattle, Washington, USA
By Angela Duparré
"Advanced characterization techniques for optical, semiconductor, and data storage components" is published by SPIE in 2002 - Bellingham, Washington, it has 192 pages and the language of the book is English.
“Advanced characterization techniques for optical, semiconductor, and data storage components” Metadata:
- Title: ➤ Advanced characterization techniques for optical, semiconductor, and data storage components
- Author: Angela Duparré
- Language: English
- Number of Pages: 192
- Publisher: SPIE
- Publish Date: 2002
- Publish Location: Bellingham, Washington
“Advanced characterization techniques for optical, semiconductor, and data storage components” Subjects and Themes:
- Subjects: ➤ Congresses - Metrology - Characterization - Information storage and retrieval systems - Semiconductors - Optical materials - Measurement
Edition Specifications:
- Pagination: viii, 192 p. :
Edition Identifiers:
- The Open Library ID: OL3774868M - OL19162755W
- Online Computer Library Center (OCLC) ID: 51157395
- Library of Congress Control Number (LCCN): 2003535275
- ISBN-13: 9780819445469
- ISBN-10: 0819445460
- All ISBNs: 0819445460 - 9780819445469
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