Accelerating Test, Validation and Debug of High Speed Serial Interfaces - Info and Reading Options
By Yongquan Fan
"Accelerating Test, Validation and Debug of High Speed Serial Interfaces" is published by Springer in Oct 13, 2014 and it has 208 pages.
“Accelerating Test, Validation and Debug of High Speed Serial Interfaces” Metadata:
- Title: ➤ Accelerating Test, Validation and Debug of High Speed Serial Interfaces
- Author: Yongquan Fan
- Number of Pages: 208
- Publisher: Springer
- Publish Date: Oct 13, 2014
“Accelerating Test, Validation and Debug of High Speed Serial Interfaces” Subjects and Themes:
- Subjects: ➤ Systems engineering - Engineering - Computer system performance - Electronics - Software engineering - Interface circuits - Testing - Very high speed integrated circuits - Electronic circuits
Edition Specifications:
- Format: paperback
Edition Identifiers:
- The Open Library ID: OL28049980M - OL17461390W
- ISBN-13: 9789400789739
- ISBN-10: 9400789734
- All ISBNs: 9400789734 - 9789400789739
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