Accelerating Test Validation And Debug Of High Speed Serial Interfaces - Info and Reading Options
By Yongquan Fan
"Accelerating Test Validation And Debug Of High Speed Serial Interfaces" was published by Springer in 2010 - Dordrecht ; London ; New York and it has 194 pages.
“Accelerating Test Validation And Debug Of High Speed Serial Interfaces” Metadata:
- Title: ➤ Accelerating Test Validation And Debug Of High Speed Serial Interfaces
- Author: Yongquan Fan
- Number of Pages: 194
- Publisher: Springer
- Publish Date: 2010
- Publish Location: Dordrecht ; London ; New York
“Accelerating Test Validation And Debug Of High Speed Serial Interfaces” Subjects and Themes:
- Subjects: ➤ Systems engineering - Engineering - Computer system performance - Electronics - Software engineering - Interface circuits - Testing - Very high speed integrated circuits - Electronic circuits
Edition Identifiers:
- The Open Library ID: OL26046479M - OL17461390W
- Library of Congress Control Number (LCCN): 2010938288
- ISBN-13: 9789048193974
- All ISBNs: 9789048193974
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