Accelerating Test, Validation and Debug of High Speed Serial Interfaces - Info and Reading Options
By Yongquan Fan

"Accelerating Test, Validation and Debug of High Speed Serial Interfaces" is published by Springer in Oct 13, 2014 - Dordrecht and it has 208 pages.
“Accelerating Test, Validation and Debug of High Speed Serial Interfaces” Metadata:
- Title: ➤ Accelerating Test, Validation and Debug of High Speed Serial Interfaces
- Author: Yongquan Fan
- Number of Pages: 208
- Publisher: Springer
- Publish Date: Oct 13, 2014
- Publish Location: Dordrecht
“Accelerating Test, Validation and Debug of High Speed Serial Interfaces” Subjects and Themes:
- Subjects: ➤ Systems engineering - Engineering - Computer system performance - Electronics - Software engineering - Interface circuits - Testing - Very high speed integrated circuits - Electronic circuits
Edition Specifications:
- Format: paperback
Edition Identifiers:
- The Open Library ID: OL28049980M - OL17461390W
- ISBN-13: 9789400789739 - 9789048193981
- ISBN-10: 9400789734
- All ISBNs: 9400789734 - 9789400789739 - 9789048193981
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