Power-Constrained Testing of Vlsi Circuits - Info and Reading Options
A Guide To The Ieee 1149.4 Test Standard
By Nicola Nicolici
"Power-Constrained Testing of Vlsi Circuits" was published by Springer in Dec 09, 2010 and it has 192 pages.
“Power-Constrained Testing of Vlsi Circuits” Metadata:
- Title: ➤ Power-Constrained Testing of Vlsi Circuits
- Author: Nicola Nicolici
- Number of Pages: 192
- Publisher: Springer
- Publish Date: Dec 09, 2010
“Power-Constrained Testing of Vlsi Circuits” Subjects and Themes:
- Subjects: ➤ Very large scale integration Integrated circuits - Semiconductors - Protection - Testing - Thermal properties - Systems engineering - Engineering - Computer-aided design - Integrated circuits, very large scale integration - Integrated circuits - Very large scale integration
Edition Specifications:
- Format: paperback
Edition Identifiers:
- The Open Library ID: OL27948179M - OL16926267W
- ISBN-13: 9781441953155
- ISBN-10: 1441953159
- All ISBNs: 1441953159 - 9781441953155
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